Micorn
Results: 53
Brand
JEDEC Compliance
ECC Support
Process Technology
- 1X nm DRAM process
- 1x nm FinFET CMOS
- 1znm-class DRAM
- 1X nm mobile DRAM
- 1Y nm DRAM process
- 1Z nm mobile DRAM
- 1Y nm mobile DRAM process
- 1Y nm-class DRAM
- 1Y nm-class mobile DRAM
- 1Y/1Z nm DRAM process
- 1β/1γ nm-class DRAM
- 3D NAND process
- Advanced LPDDR5 DRAM node
- 20nm CMOS
- 25nm-class DRAM
- 30nm-class DRAM
- 40nm CMOS
- 78nm-class DRAM
- DRAM Process Technology
Power Saving Features
- DLL-off Mode, Self Refresh, PASR
- DVFS, Deep Sleep, Self Refresh
- DVFS, Deep Sleep, Self Refresh, Write-X
- Deep Power Down, Self Refresh
- Deep Sleep Mode, Self Refresh
- Deep Sleep, Self Refresh
- Deep Sleep, Self Refresh, Partial Array Refresh
- Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), deep power-down mode
- Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), fine granularity refresh
- Power-Down, DLL-off, Self Refresh
- Power-Down, OCD Calibration, Self Refresh
- Power-Down, Self Refresh, DLL-off
- Self Refresh, Deep Power Down, Temperature Compensated Refresh
- Self Refresh, PASR
- Self Refresh, Power-Down Mode
- Sleep Mode, Power-off Notification
- Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode
Bank Architecture
- Multi-bank LPDDR4X architecture
- Multi-bank LPDDR5 architecture
- Multi-channel LPDDR5 architecture
- 8 Banks
- 8 internal banks (2 groups of 4 banks)
- 8 Banks / 4 Bank Groups
- 8 internal banks
- 8 Banks / Multi-channel
- 16 Banks / 4 Bank Groups
- 16 internal banks (8 banks per channel)
- 16 Banks (4 Bank Groups)
- 16 Banks, 4 Bank Groups
- 16 internal banks (4 groups of 4 banks)
- Multi-channel / Multi-bank
- Multi-channel architecture
- NAND Flash architecture
Refresh Mode
Temperature Grade
Pin/Ball Count
Package Size
VDD/VDDQ
Clock Frequency
Organization
Data Rate
Interface Standard
Operating Temperature Range
Product
| Image | Brand | Title | Operating Temperature Range | Interface Standard | Package Type | I/O Width | Data Rate | Density | Organization | Clock Frequency | VDD/VDDQ | Package Size | Pin/Ball Count | Temperature Grade | Refresh Mode | Bank Architecture | Power Saving Features | Process Technology | ECC Support | JEDEC Compliance |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Micron | MT53E1G32D2FW-046 AAT:B Micron | -40°C to +105°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 32Gb | 1G x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Automotive AEC-Q100 Grade 2 | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT53E1G32D2FW-046 WT:B Micron | -25°C to +85°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 32Gb | 1G x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Wide Temperature | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT53E512M32D1ZW-046 WT:B Micron | -25°C to +85°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 16Gb | 512M x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Wide Temperature | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT40A1G8SA-062E IT:E Micron | -40°C to +95°C | DDR4 SDRAM | FBGA | 8-bit | 3200MT/s | 8Gb | 1G x 8 | 1.6GHz | 1.2V (1.14V-1.26V) | 7.5mm x 10.5mm | 78 | Industrial | Auto refresh, self refresh, partial array self refresh | 16 internal banks (4 groups of 4 banks) | Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), fine granularity refresh | 20nm CMOS | Yes (On-die ECC available) | Yes (JESD79-4) | |
| Micron | MT53E1G32D2NP-046 WT:B Micron | -25°C to +85°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 32Gb | 1G x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Wide Temperature | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT53E512M32D1ZW-046 IT:B Micron | -40°C to +95°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 16Gb | 512M x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Industrial | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT53E1G32D2FW-046 IT:B Micron | -40°C to +95°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 32Gb | 1G x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Industrial | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT53E2G32D4DE-046 AAT:C Micron | -40°C to +105°C | LPDDR4X SDRAM | TFBGA | 32-bit | 4266MT/s | 64Gb | 2G x 32 | 2.133GHz | VDD1: 1.8V, VDD2: 1.1V, VDDQ: 0.6V | 10mm x 14.5mm | 200 | Automotive AEC-Q100 Grade 2 | Auto refresh, self refresh, partial array self refresh | 16 internal banks (8 banks per channel) | Ultra-low voltage operation, partial array self refresh, temperature-controlled refresh, clock stop mode | 1x nm FinFET CMOS | No (On-die ECC not available) | Yes (JESD209-4B) | |
| Micron | MT40A512M16LY-062E:E Micron | -40°C to +95°C | DDR4 SDRAM | FBGA | 16-bit | 3200MT/s | 8Gb | 512M x 16 | 1.6GHz | 1.2V (1.14V-1.26V) | 7.5mm x 13.5mm | 96 | Industrial | Auto refresh, self refresh, partial array self refresh | 8 internal banks (2 groups of 4 banks) | Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), fine granularity refresh | 20nm CMOS | No (On-die ECC not available) | Yes (JESD79-4) | |
| Micron | MT41K256M16TW-107 IT:P Micron | -40°C to +95°C | DDR3L SDRAM | FBGA | 16-bit | 1866MT/s | 4Gb | 256M x 16 | 933MHz | 1.35V (1.283V-1.45V) | 8mm x 14mm | 96 | Industrial | Auto refresh, self refresh, partial array self refresh | 8 internal banks | Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), deep power-down mode | 40nm CMOS | No (On-die ECC not available) | Yes (JESD79-3) | |
| Micron | MT40A512M16TB-062E Micron | 0°C to +95°C | DDR4 SDRAM | FBGA | 16-bit | 3200MT/s | 8Gb | 512M x 16 | 1.6GHz | 1.2V (1.14V-1.26V) | 7.5mm x 13.5mm | 96 | Commercial | Auto refresh, self refresh, partial array self refresh | 8 internal banks (2 groups of 4 banks) | Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), fine granularity refresh | 20nm CMOS | No (On-die ECC not available) | Yes (JESD79-4) | |
| Micron | MT40A256M16LY-062E Micron | 0°C to +95°C | DDR4 SDRAM | FBGA | 16-bit | 3200MT/s | 4Gb | 256M x 16 | 1.6GHz | 1.2V (1.14V-1.26V) | 7.5mm x 13.5mm | 96 | Commercial | Auto refresh, self refresh, partial array self refresh | 8 internal banks (2 groups of 4 banks) | Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), fine granularity refresh | 20nm CMOS | No (On-die ECC not available) | Yes (JESD79-4) | |
| Micron | MT41K128M16JT-125:K Micron | 0°C to +95°C | DDR3L SDRAM | FBGA | 16-bit | 1600MT/s | 2Gb | 128M x 16 | 800MHz | 1.35V (1.283V-1.45V) | 8mm x 14mm | 96 | Commercial | Auto refresh, self refresh, partial array self refresh | 8 internal banks | Low-power auto self-refresh (LPASR), temperature-controlled refresh (TCR), deep power-down mode | 40nm CMOS | No (On-die ECC not available) | Yes (JESD79-3) | |
| Micron | MT53E1G32D2FW-046 WT:B Micron | -40°C to +105°C | LPDDR4X | FBGA | x32 | 4266 MT/s | 32Gb | 1G × 32 | 2133 MHz | 1.8V / 0.6V | 9 × 13 mm | 178-ball | Automotive / Industrial | Auto Refresh / Self Refresh | 8 Banks | Deep Sleep, Self Refresh | 1znm-class DRAM | On-die ECC | LPDDR4X JEDEC | |
| Micron | MT40A1G8SA-062E IT:E Micron | -40°C to +95°C | DDR4 SDRAM | FBGA | x8 | 3200 MT/s | 8Gb | 1G × 8 | 1600 MHz | 1.2V | 8 × 12.5 mm | 78-ball | Industrial | Auto Refresh | 16 Banks / 4 Bank Groups | Self Refresh, Power-Down Mode | DRAM Process Technology | No | JEDEC DDR4 | |
| Micron | MT53E1G32D2NP-046 WT:B Micron | -40°C to +105°C | LPDDR4X | FBGA | x32 | 4266 MT/s | 32Gb | 1G × 32 | 2133 MHz | 1.8V / 0.6V | 9 × 13 mm | 178-ball | Automotive / Industrial | Auto Refresh / Self Refresh | 8 Banks | Deep Sleep Mode, Self Refresh | 1znm-class DRAM | On-die ECC | LPDDR4X JEDEC | |
| Micron | MT53E2G32D4DE-046 Micron | -40°C to +95°C | LPDDR4X | FBGA | x32 | 4266 MT/s | 64Gb | 2G × 32 | 2133 MHz | 1.8V / 0.6V | 10 × 14.5 mm | 200-ball | Industrial | Auto Refresh | 8 Banks / 4 Bank Groups | Deep Power Down, Self Refresh | 1znm-class DRAM | On-die ECC | LPDDR4X JEDEC | |
| Micron | MT62F2G32D4DS-023 Micron | -40°C to +95°C | LPDDR4X | FBGA | x32 | 4266 MT/s | 64Gb | 2G × 32 | 2133 MHz | 1.8V / 0.6V | 10 × 14.5 mm | 200-ball | Industrial | Auto Refresh / Self Refresh | 8 Banks / 4 Bank Groups | Deep Sleep, Self Refresh, Partial Array Refresh | 1znm-class DRAM | On-die ECC | LPDDR4X JEDEC | |
| Micron | MT40A512M16LY-062E:E Micron | -40°C to +95°C | DDR4 SDRAM | FBGA | x16 | 3200 MT/s | 8Gb | 512M × 16 | 1600 MHz | 1.2V | 7.5 × 13.5 mm | 96-ball | Industrial | Auto Refresh / Self Refresh | 16 Banks (4 Bank Groups) | Self Refresh, Power-Down Mode | DRAM Process Technology | No | JEDEC DDR4 | |
| Micron | MT41K256M16TW-107-IT:P Micron | -40°C to +95°C | DDR3L SDRAM | FBGA | x16 | 1866 MT/s | 4Gb | 256M × 16 | 933 MHz | 1.35V | 8 × 14 mm | 96-ball | Industrial | Auto Refresh / Self Refresh | 8 Banks | Self Refresh, PASR | DRAM Process Technology | No | JEDEC DDR3L |





























































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